Test & Measurement


Boundary-scan controllers for testing low-voltage designs and programming large flash memory arrays

18 June 2003 Test & Measurement

Spescom MeasureGraph, representing JTAG Technologies in South Africa, has announced a further extension of its line of high-performance boundary-scan IEEE Std. 1149.1 controllers with the introduction of three new members of the DataBlaster family, also known as the JT 37X7 series.

JTAG Technologies has developed its scalable architecture of boundary-scan controllers to satisfy increasing requirements for 'faster and deeper' in-system programming of flash and CPLDs, as well as complex digital PCB testing.

The new controllers, available initially in PCI and Compact-PCI (3U and 6U) forms, support unlimited target memory width (from 1 bit to more than 64 kb) for flash programming and offer the user unsurpassed sustained test clock speeds of guaranteed 40 MHz for reliable operation at the highest throughput. Users can grow in sync with their needs from the basic model to higher performance models by adding the optional enhanced throughput technology (ETT) module and/or the Flash Image module supporting on-board image memory sizes up to 128 Mbits.

Supplied with the recently-announced Quad POD, also from JTAG Technologies, the JT 37x7 DataBlaster is fully compatible with the new low-voltage technologies. It drives four synchronised TAPs (test access ports), supporting multiTAP test targets (UUTs) or gang programming of four single TAP targets. QuadPOD technology also allows maximum test speeds by incorporating high-speed signal conditioning, logic threshold adjustments and cable delay compensations into a compact, remote extension module.

The new DataBlaster range starts with the low-cost entry model JT 3707. This unit offers high-speed 40 MHz test capability and can be easily upgraded to the JT 3717 and JT 3727 with the ETT and/or the Flash Image modules for flash ISP. These modules can either be added later or the user can opt to purchase a JT 3717 or JT 3727 with the modules fitted as standard and 64 Mbits and 128 Mbits of flash capacity respectively. The ETT and Flash Image modules offer new flexibility to program memories with variable data-bus widths. Serial PROMs using I2C and/or SPI bus are now more easily accommodated.

The new JT 37x7 DataBlaster controllers are fully compatible with existing JTAG Technologies test and ISP applications, allowing easy upgrades. Compliant programs include JTAG Technologies' Test Developer, Flash Developer, PLD Developer and Production Stand-Alone software systems. Support is also provided to execute tests under National Instruments' TestStand, LabVIEW and LabWindows/CVI. Furthermore, the JT 37x7 DataBlasters are compatible with the original DataBlaster pod system (PF 2137 series) at up to 30 MHz test clock frequency.

For more information contact Van Zyl Koegelenberg, Spescom MeasureGraph, 011 266 1572, [email protected]





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