Test & Measurement


Scopes handle new speedy serial standards

23 February 2005 Test & Measurement

Tektronix claims it has developed the world's fastest, most capable realtime oscilloscopes and a new probe that will facilitate designs in the computing, communications and consumer electronics industries based on second-generation serial data standards such as second-generation PCI-Express, SATA III and double XAUI.

New member of Tektronix' TDS6000 family of digital storage oscilloscopes (DSO), the 12 GHz TDS6124C and 15 GHz TDS6154C - along with the P7313 Z-Active low-loading probe - offer customers industry-leading performance for very demanding applications. To keep pace with the worldwide explosion of high-speed technologies, engineers are tasked with developing the next-generation systems that operate at serial datarates in excess of 4 Gbps.

According to Tektronix, the TDS6154C is currently the only oscilloscope able to capture the fifth harmonic of the highest frequency pattern for next-generation serial standards such as 5 to 6,25 Gbps second-generation PCI-Express, 6 Gbps SATA III and 6,25 Gbps double XAUI. It is also the only oscilloscope able to capture the critical third harmonic of a 10 Gbps signal. The TDS6154C is able to measure rise/fall times of 30 ps (typical) with accuracy to within 5% (20/80% rise time).

Both the TDS6124C and TDS6154C provide 40 Gsps sample rate on two channels simultaneously and up to 64 M optional record length on two channels (2 M on four channels standard). This equates to the longest time window of 1,6 ms at full bandwidth and 25 ps sample interval ensuring the best resolution at full performance compared with alternative products. The TDS6000C family provides a random jitter noise floor of 420 fs rms (typical) for critical jitter measurements, which Tektronix says is lower than any competing instruments at comparable bandwidth.

For more information contact Ronel Chickory, Channels Measurement Services, +27 (0)11 254 8368, [email protected]





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