Benchtop troubleshooting tool

Test & Measurement

22 November 2000 Test & Measurement

Huntron's Tracker 4000 provides state-of-the-art troubleshooting methodology using analog signature analysis techniques. Huntron says that the dual trace CRT display quickly compares 'known good' component signatures with the device under test, thus detecting subtle problems such as IC leakage, intermittent faults, open capacitors etc. This is performed without the need to power up the circuit under test and perhaps cause further damage.

The Tracker 4000 can supply any combination of a possible 6000 selections of voltage, source resistance and test frequency. Up to 20 customised test groups can be stored internally with up to four ranges per group, so the best possible range of test parameters may be determined to produce the optimum display of the device's signature. According to the company its unique STAR (safe tracker active range) feature prevents damaging a component by setting test parameters beyond its current limitations. An integral pulse generator allows the testing of gate-fired devices such as SCRs and TRIACs.

Test versatility

The range of test parameters available makes the Tracker 4000 capable of troubleshooting a wide range of components. Passive devices, surface mount, low voltage logic, C-MOS, TTL and mixed-signal technology boards are all within the Tracker 4000's capability. Testing a circuit with differing combinations of voltage, resistance and frequency allows the user to effectively isolate components, essentially eliminating any parallel influences. For example if a capacitor is tested at 200 mV, any shunt semiconductors will remain turned off and the capacitor will be tested as if out of the circuit. Testing at a higher voltage and lower frequency will eliminate the effects of the capacitor and display the signature of the parallel device.

The Tracker works by applying a current-limited AC signal across two points of a component. This forms the unique V/I signature that represents the overall health of the device under test. Analysing the signature can quickly determine whether the component is good, bad, or marginal.

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Benchtop troubleshooting tool

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