Universal waveform generator offers higher performance
18 October 2006
Test & Measurement
Comtest has announced the launch of Fluke's 29X Series of Universal Waveform Generators. The 29X series of arbitrary waveform generators extend the Fluke range offering with higher clock frequency rates; deeper memory; unlimited waveform storage; increased performance and a USB interface included with the standard RS232 and IEEE 488.2 interfaces.
Functions and specifications are extended with the following additions and performance improvements:
* Compact Flash Memory card and memory card reader/writer is provided as standard with a 291, 292 or 294 Generator. Up to 500 complete setups or arbitrary waveforms can be stored on the CF memory card. The card writer/reader can be used on a PC to build arbitrary waveforms and then it can simply be taken back to the lab or test rack and be plugged into the generator.
* Output frequency range is 0,1 mHz to 40 MHz for sine, 50 MHz for square and up to 500 kHz for triangle, ramps and sine (x)/x.
* Rise time for pulse is <8 ns with a period range of 40 ns to 100 s. Output amplitude range can be adjusted from 2,5 mV to 10 V pk-pk into 50 Ω.
* The 29X series increases the sample clock rate to 100 MS/s and increases the maximum arbitrary waveform memory depth to 1 M points to provide the ability to create high-resolution complex arbitrary waveforms.
Available in either 1, 2 or 4 Channel and 100 MS/s 40 MHz, the 29X series also features a new innovative feature; the external sample clock. In current models using the Variable Sample clock mode, the full number of points of a waveform must be completed before a frequency change can take place. Using the External Sample clock input, the speed of replay of the waveform points and thus the output frequency of the waveform can be changed. This allows the output signal to be varied on demand at any point in the waveform.
For more information contact Hilton Preston, Comtest, +27(0) 11 254 2201, hpreston@comtest.co.za
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