Test & Measurement


X-ray inspection system provides 2.0 megapixel imaging

25 July 2007 Test & Measurement

Dage has announced that its XiDAT XD7600NT digital X-ray inspection system is now equipped with a standard 2.0 megapixel imaging system.

The system's innovative look and manipulator design provide oblique angle viewing of up to 70° for any position and 360° around any point of the entire 458 mm x 407 mm inspection area, allowing the XD7600NT to inspect all interconnections and PCBs containing BGA and CSP devices.

The XD7600NT comes standard with the Dage NT250 x-ray tube with 250 nanometers sub-micron feature recognition and realtime digital inspection at 2.0 megapixel, viewed on a 24" flat panel LCD display with up to 9200 X magnification. The image quality and enhanced feature recognition of the NT250 tube, combined with the XiDAT 2.0 imaging system and its easy to use ImageWizard software, provide world class inspection quality.

The system can be equipped with a computerised tomography (CT) option providing 3D modelling and volumetric measurement of solder joints. It can be easily converted between 2D and 3D modes, making it a common platform for analysis of solder interconnections for critical applications such as stacked die, MEMS, package-in-package and package-on-package.





Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...
Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...
PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...
Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...
CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...
Webinar: The key to smart occupancy
Test & Measurement
This one-hour session will allow the attendee to discover the company’s latest infrared sensor with high-sensitivity presence and motion detection capabilities.

Read more...