Ingun's new tip-style 60 test probe is aimed at testing applications utilising Agilent Bead Probe technology. This technology addresses test point accessibility on densely populated printed circuit boards, by specifying how test targets, or bead probes, can be placed directly onto copper signal traces, providing test access points virtually anywhere on a board layout.
This test probe allows reliable targeting of a bead probe as well as breaking open the Bead surface. This is made possible by using fine, aggressive points, which are spread out over the complete surface of the tip head. The shortness of the points in combination with the choice of a high contacting force ensures multiple contacting without contact to the sealing lacquer, serving to prolong the probe's life expectancy.
The tip-style 60 is compatible to Ingun's standard series GKS-050/075/100; therefore all available spring forces, receptacles and assembly tools can be used.
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