New connectorless test probe

5 March 2008 Test & Measurement

Samtec recently introduced its new Spirit Connectorless Test Probe (SCTP Series) to address the need for high speed serial protocol testing with quick and reliable connection to electrically sensitive signals.

The Spirit Probe employs 100 Ω differential pair signal routing and a patent-pending, replaceable, bifurcated compression contact array system on the device-under-test end with Samtec's high speed Q Strip connectors on the instrument end. This connectorless system provides for non-intrusive testing from 1,25 to 5,2 Gbps and is compatible with the Intel-specific PCI Express protocol footprint.

For increased reliability and longevity, the probe features a spring-loaded shroud to protect the compression contact tips from damage, while the replaceable contact array extends the life of the probe indefinitely.

The Spirit Probe is available as components or in a complete kit with probe, replacement contact arrays, extraction tool and probe fasteners. Application specific logic to protocol analysis applications with differential pair counts and pin-out maps are also available.

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