Protocol test and monitoring solution for LTE
19 March 2008
Test & Measurement
Tektronix has launched its 3GPP long term evolution (LTE) protocol test and monitoring solution that covers all protocol layers and physical interfaces, including air and fixed line interfaces, in one integrated offering.
The solution includes the G35-LTE (functional and load test platform) and the NSA-LTE (scalable platform for monitoring, troubleshooting and optimisation), both of which are based on proven platforms used in testing 3G, mobile WiMAX and HSDPA technologies in networks around the world.
As consumer demand grows for richer services and connected lifestyles, mobile networks are evolving to meet the growing demand for bandwidth and advanced applications. LTE is poised to deliver a tenfold improvement of capacity and throughput, reducing deployment and operational costs. At the same time, LTE networks introduce major architectural and technological changes. Changing infrastructure architecture, coupled with evolving standards, demands reliable test, measurement and monitoring solutions that meet the challenges related to effective design cycles and rapid deployment schedules. These tools also need to be available as soon as the standardisation bodies have released the technical specs.
Tektronix’ G35-LTE solution provides functional, load generation, conformance, interoperability and performance testing of LTE air and fixed line interfaces through a single, fully integrated test system. It enables customers to reduce time to market and to maximise the productivity of test activities during the development and market introduction of LTE network elements.
For LTE monitoring, troubleshooting and optimisation, the NSA-LTE is available. Probes for all LTE wireline and air interfaces, combined with comprehensive real-time analysis capabilities, enable complex LTE test procedures in a powerful and easy to use toolset. The solution’s online dashboards provide information about the test progress at a glance, and customisable Key Performance Indicators allow for rapid data reduction and focus on the areas under test.
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