Test & Measurement


XJTAG supports phase change memory

13 October 2010 Test & Measurement

XJTAG recently announced its support for Micron Omneo phase change memory (PCM).

PCM enables enhanced system performance, and is programmed in situ after the board is assembled. XJTAG, working with Micron, has developed a solution to program PCM at close to its maximum programming speed using the XJTAG boundary scan system. It will allow customers to program PCM quickly on production lines or in development labs. This builds on XJTAG’s successful XJFlash solution for high-speed programming of Flash memories.

The XJTAG boundary scan system is fast and easy to use for development or production, with features such as its high-level test description language, graphical application helping engineers to visualise their circuits, and automated connectivity tests and DFT analysis. XJTAG’s software calculates how to utilise the boundary scan chain to maximise test coverage and accelerate programming of devices such as memories and PLDs. Used in conjunction with the XJTAG boundary scan debug, test and programming system, XJFlash can be used to program and verify PCM devices provided there is an FPGA or CPU on the target board and this is connected up to the JTAG chain correctly.



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