NI expands FlexRIO family
6 July 2011
Test & Measurement
National Instruments has expanded its NI FlexRIO product line with six new adapter modules featuring FPGA-based reconfigurable I/O to deliver enhanced functionality for general-purpose automated test and high-speed digital communication.
The FlexRIO family is a commercial off-the-shelf (COTS) solution providing engineers with the flexibility of LabVIEW FPGA technology and high-speed, user-configurable I/O on the PXI platform. The new group of adapter modules includes four general-purpose digitisers, a module for high-speed digital I/O and a high-speed 16-bit analog-to-digital converter (ADC) from Analog Devices which is optimised for modulated communications.
All NI FlexRIO solutions require two distinct hardware components – an I/O-specific adapter module and a PXI-based FlexRIO FPGA module, which features a Xilinx Virtex-class field-programmable gate array (FPGA). With 15 different NI FlexRIO adapter modules now available, engineers and scientists can directly interface FPGAs to a broad variety of I/O for measurement applications requiring real-time performance, low-latency processing and reconfigurable behaviour.
The modules also integrate with the new NI FlexRIO instrument development library, a collection of LabVIEW host and FPGA code designed to provide capabilities commonly found in instruments such as acquisition engines, DRAM interfaces and trigger logic, along with the associated host APIs. Additionally, the new NI-573xR example instrument driver builds on the code from the instrument development library to create a default FPGA personality and familiar host API for using an NI 573x adapter module as a basic digitiser.
For more information contact National Instruments, 0800 203 199, sales@natinst.co.za, www.ni.com/southafrica
Further reading:
AI-ready rugged spectrum analysis for the field
Vepac Electronics
Test & Measurement
The HAROGIC PXR Series is a rugged, benchtop-grade spectrum analyser and an AI-ready open platform in a single portable instrument.
Read more...
Digid announces its nanoscale temperature and force sensors are ready for mass deployment
Test & Measurement
Digid, a pioneer of nanoscale sensing technology, recently announced that its patented printed electronics fabrication technology has been fully qualified for volume production of temperature and force sensors as small as 1 µm long.
Read more...
Multichannel AWGs for GHz signal generation
Vepac Electronics
Test & Measurement
Spectrum Instrumentation has introduced its new flagship Arbitrary Waveform Generators with a maximum of 6 channels at 10 GS/s or 12 channels at 5 GS/s output speed.
Read more...
100ZR evaluation added to test instruments
Tamashi Technology Investments
Test & Measurement
Anritsu Corporation has added 100ZR coherent optical transceiver evaluation to its portable Network Master Pro MT1040A/MT1000A testers, enabling comprehensive communication performance testing for the next-generation 100ZR standard.
Read more...
Multichannel digitisers
Vepac Electronics
Test & Measurement
Spectrum Instrumentation has released new flagship digitisers with 12-bit resolution and a maximum of 6 channels at 10 GS/s or 12 channels at 5 GS/s acquisition speed.
Read more...
Aligning clocks over large distances
ASIC Design Services
Test & Measurement
SkyWire technology from Microchip makes it easier to align and compare clocks within nanoseconds across geographic locations.
Read more...
Scalable power solutions up to 3 kW
Accutronics
Test & Measurement
GAIA Converter has introduced the MGDM-500/P power module with a new parallel option for scalable power solutions up to 3 kW.
Read more...
New technique for measuring DNA damage could improve cancer therapy
Test & Measurement
Scientists at the National Institute of Standards and Technology have developed a new technology for measuring how radiation damages DNA molecules.
Read more...
Precise DC power analysis
Conical Technologies
Test & Measurement
The ITECH IT2705 DC power analyser is designed to help engineers and researchers capture it all, from the tiniest deep sleep currents to the highest peak operating loads.
Read more...
What is a JTAG connector?
Spectrum Concepts
Test & Measurement
JTAG was originally created to test for common problems, but lately, it has become a way of configuring devices.
Read more...