Test & Measurement


PIM analyser

25 January 2012 Test & Measurement

Anritsu has introduced the MW8209A PIM Master, a passive intermodulation (PIM) analyser that covers the 900 MHz band to address the growing need to measure PIM in E-GSM networks, including UMTS Band VIII and LTE Band 8. Designed for use with Anritsu handheld analysers, the instrument comes with Anritsu’s Distance-to-PIM technology, a tool that can determine if the cause of PIM is at the base station or in the surrounding environment.

Field engineers and technicians can use the MW8209A to help ensure optimum performance of UMTS Band VIII and LTE Band 8 networks by locating PIM faults before intermodulation distortion adversely affects signal transmission.

Field personnel can use PIM Master to generate two high-power tones in the transmit band of a base station, and use any of the compatible handheld analysers to measure the 3rd, 5th or 7th order intermodulation products in the receive band that travel down the same cable. Using the GPS option available on all the analysers, the location of the measurement can be recorded, as well.

A beneficial feature of the MW8209A is its 40 W testing, compared to alternative methods that only measure at 20 W. Using double the power allows the PIM Master to locate intermittent failures due to light corrosion, high-traffic loading or changing weather conditions. It also permits users to find faults in a multicarrier antenna system or discover microscopic arcing in connectors.

Anritsu’s proprietary Distance-to-PIM helps field engineers, technicians and contractors pinpoint passive intermodulation faults, eliminating the unknown of whether the PIM source is from the antenna system or surrounding environment. Simple, immediate and accurate, Distance-to-PIM simultaneously informs the user of the distance and magnitude of all the PIM sources, both inside the antenna system and beyond the antenna. Historical data can be used to monitor a site and determine if corrections need to be made before a failure results in dropped or blocked calls.





Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...
Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...
PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...
Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...
CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...
Webinar: The key to smart occupancy
Test & Measurement
This one-hour session will allow the attendee to discover the company’s latest infrared sensor with high-sensitivity presence and motion detection capabilities.

Read more...