New digitiser and updated jitter analysis toolkit from NI
20 March 2013
Test & Measurement
National Instruments announced the PXIe-5162 digitiser and updates to the LabVIEW Jitter Analysis Toolkit.
The digitiser, with 10 bits of vertical resolution and a 5 GSps sample rate, provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope. With 1,5 GHz of bandwidth and four channels in a single slot, it is suited for high-channel-count digitiser systems in manufacturing test, research and device characterisation.
Engineers can use the digitiser with LabVIEW and the LabVIEW Jitter Analysis Toolkit, which provides a library of functions optimised for performing the high-throughput jitter, eye diagram and phase noise measurements demanded by automated validation and production test environments.
The toolkit provides built-in functions for clock recovery, eye diagram, jitter, level and timing measurements. Example programs are available for eye diagram and mask testing, and random and deterministic jitter (RJ/DJ) separation using both dual-Dirac and spectrum-based separation methods.
For more information contact National Instruments, 0800 203 199, [email protected], www.ni.com/southafrica
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