New digitiser and updated jitter analysis toolkit from NI

20 March 2013 Test & Measurement

National Instruments announced the PXIe-5162 digitiser and updates to the LabVIEW Jitter Analysis Toolkit.

The digitiser, with 10 bits of vertical resolution and a 5 GSps sample rate, provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope. With 1,5 GHz of bandwidth and four channels in a single slot, it is suited for high-channel-count digitiser systems in manufacturing test, research and device characterisation.

Engineers can use the digitiser with LabVIEW and the LabVIEW Jitter Analysis Toolkit, which provides a library of functions optimised for performing the high-throughput jitter, eye diagram and phase noise measurements demanded by automated validation and production test environments.

The toolkit provides built-in functions for clock recovery, eye diagram, jitter, level and timing measurements. Example programs are available for eye diagram and mask testing, and random and deterministic jitter (RJ/DJ) separation using both dual-Dirac and spectrum-based separation methods.

For more information contact National Instruments, 0800 203 199, [email protected], www.ni.com/southafrica

Further reading:

New technique for measuring DNA damage could improve cancer therapy
Test & Measurement
Scientists at the National Institute of Standards and Technology have developed a new technology for measuring how radiation damages DNA molecules.

Read more...

---

Precise DC power analysis
Conical Technologies Test & Measurement
The ITECH IT2705 DC power analyser is designed to help engineers and researchers capture it all, from the tiniest deep sleep currents to the highest peak operating loads.

Read more...

---

What is a JTAG connector?
Spectrum Concepts Test & Measurement
JTAG was originally created to test for common problems, but lately, it has become a way of configuring devices.

Read more...

---

SIGLENT launches new 8 GHz DSO
Vepac Electronics Test & Measurement
SIGLENT has unveiled the enhanced SDS7000A/AP models, building on the success of its SDS7000A high-resolution digital oscilloscope series.

Read more...

---

Multi-functional high-res oscilloscopes
Coral-i Solutions Test & Measurement
RIGOL Technologies has launched two powerful additions to its oscilloscope portfolio that are tailored to meet the growing challenges of power electronics, automotive systems, and high-speed digital designs.

Read more...

---

TDK expands programmable PSU series
Accutronics Test & Measurement
With a 3U high chassis, the GAC and GAC-PRO provide extremely high-power density for a fully featured programmable AC power source.

Read more...

---

Analysing magnetic fields
Accutronics Test & Measurement
The engineers at Narda Safety Test Solutions have achieved a breakthrough in isotropic measurement and analysis of low-frequency magnetic fields in the form of their latest digital H-field probe.

Read more...

---

A new class of sampling scope
Comtest Test & Measurement
The PicoScope 9400A Series combines the huge analogue bandwidth of sampling oscilloscopes with the triggering architecture of real-time oscilloscopes.

Read more...

---

Single channel, programmable PSU
Electrocomp Express Test & Measurement
Rohde & Schwarz’ NGC101 is a NGC100-series power supply with a wide range of functions that make them ideal for use in development labs and industrial environments.

Read more...

---

Next-gen LineScan camera
Eagle Africa Technology Test & Measurement
New Imaging Technologies has launched the new LiSaSWIR, its next-generation SWIR LineScan camera and sensor.

Read more...

---