Test & Measurement


Oscilloscope gains audio signal triggering and decoding

17 April 2013 Test & Measurement

I²S, LJ, RJ and TDM are serial buses that implement unidirectional point-to-point connections. They carry digital audio data between ICs and are often used to connect analog-to-digital converters and digital-to-analog converters to digital signal processors (DSP) for audio processing.

The new –K5 option for the RTO high-performance oscilloscope from Rohde & Schwarz addresses the complex requirements in the development of electrical components equipped with audio interfaces.

An extensive selection of protocol-specific trigger conditions provides the user with a high degree of flexibility when trying to detect specific data contents. The oscilloscope’s hardware-implemented triggers ensure high acquisition rates for fast measurements. Explanatory graphics and links to related settings simplify configuration.

Evaluating the test data is also easy: protocol details in the decoded bus signals are colour-coded and protocol data is summarised. A track function displays the decoded audio signal as an analog waveform. These features allow users to quickly and easily find design problems that cause clipping, glitches and other anomalies.

For more information contact Trevor Grundlingh, Protea Electronics, +27 (0)11 719 5700, [email protected], www.protea.co.za





Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

Identifying interference in 5G and LTE networks
Test & Measurement
The latest Field Master software release provides a dual display of the LTE or 5G Frame structure, with automatic placement of gates on the Uplink slots alongside the RF spectrum of the gated time slots.

Read more...
High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...
Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...
PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...
Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...
CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...