Test solution for 5G New Radio
21 February 2018
Test & Measurement
National Instruments announced a sub-6 GHz 5G test reference solution compliant with the 3GPP Release 15 specification for 5G New Radio (NR).
With commercial 5G NR deployments below 6 GHz on the horizon, engineers are actively developing sub-6 GHz 5G RF components and devices. The accelerated pace of 5G standardisation is driving intense pressure to bring products to market quickly. NI’s sub-6 GHz 5G NR reference solution is a cost-effective and high-performance option for test that helps engineers quickly characterise their designs and more easily transition from R&D to production test environments.
The solution is well suited for testing new wideband RFICs, especially those operating in the 3,3 – 4,2 GHz and 4,4 – 5,0 GHz bands. Engineers can test devices operating with 400 MHz of continuous signal bandwidth and beyond with the PXIe-5840 vector signal transceiver (VST), which includes 1 GHz of instantaneous signal generation and analysis bandwidth up to 6 GHz. With the NI VST, the solution delivers residual EVM performance better than 0,32% (-50 dB) for 100 MHz NR signals along with faster measurement speed.
A critical component of this solution is NI-RFmx NR measurement software, which has evolved in conjunction with the 3GPP specification. The latest version of the software offers 5G NR waveforms and measurement capability compliant with the first official specification of 3GPP Release 15 for non-standalone NR, which empowers engineers to test both OFDMA and DFT-s-OFDM carrier aggregated waveforms with flexible subcarrier spacing from 15 kHz to 120 kHz.
For more information contact National Instruments, 0800 203 199, [email protected], http://southafrica.ni.com
Further reading:
New technique for measuring DNA damage could improve cancer therapy
Test & Measurement
Scientists at the National Institute of Standards and Technology have developed a new technology for measuring how radiation damages DNA molecules.
Read more...
Precise DC power analysis
Conical Technologies
Test & Measurement
The ITECH IT2705 DC power analyser is designed to help engineers and researchers capture it all, from the tiniest deep sleep currents to the highest peak operating loads.
Read more...
What is a JTAG connector?
Spectrum Concepts
Test & Measurement
JTAG was originally created to test for common problems, but lately, it has become a way of configuring devices.
Read more...
SIGLENT launches new 8 GHz DSO
Vepac Electronics
Test & Measurement
SIGLENT has unveiled the enhanced SDS7000A/AP models, building on the success of its SDS7000A high-resolution digital oscilloscope series.
Read more...
Multi-functional high-res oscilloscopes
Coral-i Solutions
Test & Measurement
RIGOL Technologies has launched two powerful additions to its oscilloscope portfolio that are tailored to meet the growing challenges of power electronics, automotive systems, and high-speed digital designs.
Read more...
TDK expands programmable PSU series
Accutronics
Test & Measurement
With a 3U high chassis, the GAC and GAC-PRO provide extremely high-power density for a fully featured programmable AC power source.
Read more...
Analysing magnetic fields
Accutronics
Test & Measurement
The engineers at Narda Safety Test Solutions have achieved a breakthrough in isotropic measurement and analysis of low-frequency magnetic fields in the form of their latest digital H-field probe.
Read more...
A new class of sampling scope
Comtest
Test & Measurement
The PicoScope 9400A Series combines the huge analogue bandwidth of sampling oscilloscopes with the triggering architecture of real-time oscilloscopes.
Read more...
Single channel, programmable PSU
Electrocomp Express
Test & Measurement
Rohde & Schwarz’ NGC101 is a NGC100-series power supply with a wide range of functions that make them ideal for use in development labs and industrial environments.
Read more...
Next-gen LineScan camera
Eagle Africa Technology
Test & Measurement
New Imaging Technologies has launched the new LiSaSWIR, its next-generation SWIR LineScan camera and sensor.
Read more...