Test & Measurement


Optical measurement solution is scalable

17 July 2002 Test & Measurement

Design and production engineers now can measure the power of light in optical component alignment, manufacturing and test in a solution that scales from the design laboratory to the manufacturing floor.

Using National Instruments' LabVIEW graphical development environment with NI data acquisition (DAQ) boards and third-party optical sensors, engineers have a measurement solution that can meet both the rigorous requirements of the lab and provide the throughput and high channel count needed for the manufacturing floor. This scalability delivers a long-term cost-effective measurement solution.

The NI 6052E data acquisition board for PCI and PXI has a 333 kSa/s sampling rate, 16 analog inputs and 16 bit resolution. With this performance, the NI-based solution scales to applications in production and test, such as synchronising optical power measurements with motion to decrease alignment and assembly time.





Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

SIGLENT launches new 8 GHz DSO
Vepac Electronics Test & Measurement
SIGLENT has unveiled the enhanced SDS7000A/AP models, building on the success of its SDS7000A high-resolution digital oscilloscope series.

Read more...
Multi-functional high-res oscilloscopes
Coral-i Solutions Test & Measurement
RIGOL Technologies has launched two powerful additions to its oscilloscope portfolio that are tailored to meet the growing challenges of power electronics, automotive systems, and high-speed digital designs.

Read more...
TDK expands programmable PSU series
Accutronics Test & Measurement
With a 3U high chassis, the GAC and GAC-PRO provide extremely high-power density for a fully featured programmable AC power source.

Read more...
Analysing magnetic fields
Accutronics Test & Measurement
The engineers at Narda Safety Test Solutions have achieved a breakthrough in isotropic measurement and analysis of low-frequency magnetic fields in the form of their latest digital H-field probe.

Read more...
A new class of sampling scope
Comtest Test & Measurement
The PicoScope 9400A Series combines the huge analogue bandwidth of sampling oscilloscopes with the triggering architecture of real-time oscilloscopes.

Read more...
Single channel, programmable PSU
Electrocomp Express Test & Measurement
Rohde & Schwarz’ NGC101 is a NGC100-series power supply with a wide range of functions that make them ideal for use in development labs and industrial environments.

Read more...
Next-gen LineScan camera
Eagle Africa Technology Test & Measurement
New Imaging Technologies has launched the new LiSaSWIR, its next-generation SWIR LineScan camera and sensor.

Read more...
Ultra-portable spectrum analyser
Vepac Electronics Test & Measurement
The PXN-400Z from Harogic is a handheld spectrum analyser covering a frequency range of 9 kHz to 40 GHz with a 100 MHz analysis bandwidth.

Read more...
Why your next oscilloscope should be PC-based
Comtest Test & Measurement
For decades, traditional benchtop oscilloscopes have been a cornerstone of engineering, offering reliability, precision, and familiarity. However, as technology evolves, so do the tools we rely on.

Read more...
Versatile 3-in-1 instrument
Vepac Electronics Test & Measurement
The ARB Rider AWG-2000 is the cost-effective and powerful two or four channel arbitrary function generator and two or four channel arbitrary waveform generator with advanced sequencer functionality.

Read more...









While every effort has been made to ensure the accuracy of the information contained herein, the publisher and its agents cannot be held responsible for any errors contained, or any loss incurred as a result. Articles published do not necessarily reflect the views of the publishers. The editor reserves the right to alter or cut copy. Articles submitted are deemed to have been cleared for publication. Advertisements and company contact details are published as provided by the advertiser. Technews Publishing (Pty) Ltd cannot be held responsible for the accuracy or veracity of supplied material.




© Technews Publishing (Pty) Ltd | All Rights Reserved