Test & Measurement


VXI pulse/pattern generators highly veratile

16 Feb 2000 Test & Measurement

Agilent Technologies has introduced two multipurpose pulse/pattern generators that offer highly accurate digital signals at up to 165 MHz or up to 330 MHz, respectively. The HP E8311A and HP E8312A VXI C-1 pulse/pattern generators, targeted for designers and integrators of VXI automated test systems, can be used for a wide variety of applications ranging from functional verification of high-speed digital or mixed signal devices, to clock generation and serial bus testing.

Agilent says the timing parameters of the VXI pulse/pattern generators can be adjusted for every amplitude or offset level to meet any specification, even 10 Vpp, (50 y into 50 y), when the transition time is 2 ns.

Both new VXI modules, because of the fixed trigger-in/signal-out delay and variable delay ranges, provide highly reliable and stable synchronisation of test systems even at very precise points in time, such as those used in radar testing. The HP E8311A and HP E8312A provide double pulses for simulating radar test signals.

Serial patterning capabilities at up to 16 Kbps per channel permit design engineers to simulate complex protocols, using preconfigured standard formats such as RZ, NRZ, DNRZ or PRBS. Pulse-width modulated signals, such as those used for testing revolution counters, also can be easily simulated.

The VXI pulse/pattern generators test both low-speed (10 to 100 MHz) and high-speed (greater than 100 MHz) logic devices. Their variable transition times guarantee that rise and fall measurements are fully adjustable, thereby avoiding spikes, crosstalk and ringing when logic designs are tested at low speeds. Inverted outputs allow users to generate differential signals for testing high-speed buses based on LVDS technology for other specialized computer and communications applications.



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