View logic analyser and oscilloscope data on one integrated display

Test & Measurement

9 October 2002 Test & Measurement

Today almost every design is a high-speed design, with fast clock edges and data rates on even the most common IC devices. So nearly every design requires signal integrity analysis. Engineers need to see the analog characteristics of high-speed digital signals in relation to complex digital events in the circuit.

This is according to test and measurement company Tektronix who offers a solution. The iView (Integrated View) capability offered, seamlessly integrates data from Tektronix logic analysers and oscilloscopes, allowing designers to transfer analog waveforms from the oscilloscope to the logic analyser display. The result is that engineers can quickly track down elusive signal integrity problems in their designs.

The iView package includes TLA Application Software and an interconnect cable to integrate TLA600 or TLA700 Series logic analysers with a wide range of external TDS Series oscilloscopes. iView capability couples selected Tektronix TDS family oscilloscopes with TLA series logic analysers, producing a solution that shows, on the same logic analyser display, time-correlated views of both digital and analog waveforms.

Set-up is claimed to be easy through the use of an external oscilloscope 'wizard' in the TLA logic analyser user interface that guides the user through set-up and connection. No user calibration or calibration fixture is required. And, once set-up is completed, iView is completely automated, says the manufacturer.

For more information contact Channels, 0800 11 7850.

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View logic analyser and oscilloscope data on one integrated display

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