Test & Measurement


2,7 GHz signal analyser speeds testing

23 October 2002 Test & Measurement

The NI PXI-5660 2,7 GHz RF signal analyser from National Instruments lets engineers now perform RF measurements up to 200 times faster. A powerful combination of spectral measurement software and a broadband 2,7 GHz RF digitiser with greater than 80 dB dynamic range, the virtual instrumentation architecture of the PXI-5660 delivers the full range of standard RF power, frequency, spectral, and vector measurements, yet it also gives customers the freedom to define unique applications using the advanced signal processing, visualisation, and Internet capabilities of LabVIEW.

It consists of a broadband RF down-converter, a high spectral purity IF digitiser, and the Spectral Measurements Toolkit (SMT) for NI LabVIEW and LabWindows/CVI. The broadband RF front end acquires signals between 9 kHz and 2,7 GHz with up to 20 MHz realtime bandwidth, and has an onboard ultra-high-stability oven-controlled oscillator (OCXO) to provide the frequency accuracy and stability required for automated applications. The NI PXI-5660 features a spurious free dynamic range of greater than 80 dB for precise measurements. All this functionality is squeezed into a compact 3U PXI form factor.

The SMT provides common measurements such as power spectrum, peak power and frequency, power-in-band, adjacent channel power, and occupied bandwidth. The combination of the optimised algorithms in the SMT and GHz processing of the PC delivers high measurement throughput. Engineers and scientists can use the broadband capability and deep memory of the NI PXI-5660 to capture both instantaneous frequency and phase information, and then use the powerful analysis tools in LabVIEW to make advanced I/Q and modulation measurements.

For applications such as consumer electronics or avionics test that require a broad range of functionality, the NI PXI-5660 can be tightly integrated with other PXI system resources from NI or third parties such as RF switches, DMMs, signal sources, digitisers, motion control, and digital imaging. The PXI-based RF signal analyser ideal for a variety of frequency domain applications, including spectral analysis, EMC testing, and RF component testing.





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