Test & Measurement


New logic analysis modules for the complex digital world

29 January 2003 Test & Measurement

The digital designer of today is facing new challenges. Changing bus architectures, changing clocking schemes, complex packet structures, higher speeds, shrinking timing margins, small amplitudes and differential signals, increasing DDR memory speeds. They face new technologies like PCI Express, RapidIO, HyperTransport and processor busses with highly encoded data, complex protocols and higher speeds.

Designers are moving into a new world with new problems that require new tools for effective and productive debugging and troubleshooting. Thus, Agilent has introduced four new logic analyser modules for its 16700 Series logic analysers. The 16753A, 16754A, 16755A and the 16756A measurement modules can asssist engineers with the debug and validation of their leading edge high speed digital designs with greater confidence and in less time.

Key features: state analysis up to 600 MHz on all channels; varying memory depths available, from 1 M to 64 M; 4 GHz 'timing zoom' (simultaneous timing analysis on all channels) with 64 K memory depth; 1,2 GHz, 128 M deep memory timing analysis; 'eye scan' feature; low-capacitance, high reliability and density probing; 68 channels per module, and up to 340 channels by combining modules.

For more information contact Concilium Technologies, 012 678 9200; sharecall: 0860 102 764, [email protected]



Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

Anritsu announce a test solution for PCIe 5.0
Coral-i Solutions Test & Measurement
Granite River Labs and Anritsu Corporation have announced that their jointly developed PCI Express (PCIe) 5.0 automated test solution has been approved by PCI-SIG for “gold suite” product compliance testing.

Read more...
Connectors for the evolving world of test and measurement
Spectrum Concepts Test & Measurement
Instrumentation employed to test new products needs to become more advanced to keep up with rapidly advancing technology.

Read more...
Tektronix reimagines performance and portability in oscilloscopes
RS Components (SA) Test & Measurement
The new 2 series of oscilloscope can move from the bench to the field and back, enabling workflows previously not possible.

Read more...
All-in-one documenting process calibrators
Comtest Test & Measurement
The multifunction calibrators perform sourcing, simulation and measurement of pressure, temperature and electrical signals.

Read more...
Avoiding safety hazards during solar PV installations
Comtest Test & Measurement
Safety levels during solar panel commissioning and installation have been strengthened by Fluke’s CAT III 1500 V true-RMS clamp meter.

Read more...
World’s fastest 16-bit arbitrary waveform generator
Vepac Electronics Test & Measurement
The ARB Rider AWG-5000 has a 6,16 GS/s real-time update rate with a 16-bit vertical resolution and is available in two, four or eight channel models.

Read more...
Modbus probes gain support for parity options
RF Design Test & Measurement
The marquee feature of firmware version 1.06 facilitates the use of odd, even, mark or space parity modes when communicating with bus probes.

Read more...
Embrace the full power of J-Link debug probes
CST Electronics Test & Measurement
J-Link is supported by all major IDEs, from free Eclipse-based ones up to commercial-grade ones like Segger Embedded Studio.

Read more...
40 GHz RF power sensor
Conical Technologies Test & Measurement
Mini-Circuits’ PWR-40PW-RC is a USB/Ethernet-controlled power sensor capable of making many different measurements.

Read more...
Power device analyser
Concilium Technologies Test & Measurement Power Electronics / Power Management
Keysight’s new PD1550A is an advanced double-pulse tester that enables customers to test entire power modules quickly and easily.

Read more...