Test & Measurement


Latest Articles

New software performs serial data link analysis
28 November 2007
Tektronix has announced a new end-to-end high speed serial data analysis software package with test capabilities extending from a transmitter to a receiver and including the connecting channel. The ...

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Fluke introduces new current clamps
28 November 2007, Comtest
Fluke has launched several new current clamps. The i6000 AC current clamp utilises the Rogowski principle and can be used to measure currents up to 6000 A when used in conjunction with multimeters, recorders, ...

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TDI sensors for high-speed imaging applications
28 November 2007, Hamamatsu Photonics UK
Hamamatsu's S10200 is a new TDI (time delay integration) sensor, featuring the latest high speed, high sensitivity, back thinned CCD image sensors. These sensors have an option for 1024, 2048 or 4096 ...

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Realtime spectrum analyser for digital RF wins award
14 November 2007
The RSA6100A Series realtime spectrum analysers from Tektronix received the Editor's Choice Award in Electronic Engineering Times-China Annual Creativity in Electronics (ACE) Awards for the most significant ...

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Measure milliamp signals without breaking the loop
14 November 2007, Comtest
The 771 is Fluke's latest innovative approach to measuring milliamp loop signals, where lifting a wire from a terminal (breaking the loop) is now no longer necessary. This directly impacts maintenance ...

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Handheld scopes rated no. 1
14 November 2007, Concilium Technologies
Agilent Technologies' series of handheld digital oscilloscopes were voted the number one Product of the Year by readers of Elektronik, one of Europe's key electronics magazines. The Agilent U1600A Series ...

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Integrated functional test and diagnostics system
31 October 2007, Test & Rework Solutions
Built on Universal Design Architecture (UDA), powered by TestVue software and using industry standards, the DTec system from DiagnoSYS provides a flexible and scalable functional test platform with inherent ...

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New variable speed optical attenuator for broadband testing
31 October 2007, Comtest
JDSU has announced the latest version of its Variable Optical Attenuator for the JDSU Multiple Application Platform (MAP). The MAP Variable Optical Attenuator provides what is claimed to be the industry's ...

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Jitter/wander field test solution for triple-play services
17 October 2007, Comtest
JDSU has announced the introduction of a highly accurate field solution for measuring 2,5/2,7G SONET/SDH jitter. Available as a complement to existing T-BERD/MTS-8000 Transport modules, the jitter/wander ...

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Mylar sensor film indicates pressure distribution
17 October 2007
Sensor Products produces a film capable of measuring and indicating pressure by immediately and permanently changing colour according to the pressure applied. This is conceptually similar to the measurement ...

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Palmtop oscilloscope samples up to 100 MSps
3 October 2007, K Measure
The S2X100 palmtop oscilloscope from Dynon Instruments is a powerful instrument which fits in the palm of a hand and connects to a computer via a USB port. It is also bus powered, which means there is ...

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Integrated x-ray source for in-line product inspection
3 October 2007, Hamamatsu Photonics UK
Hamamatsu has introduced the new 90 kV microfocus X-ray source, the L9421-02, which is ideal for in-line product inspection for electronic, industrial, aerospace and automotive applications. The L9421-02 ...

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10 Gigabit Ethernet test solution
19 September 2007, Lambda Test
EXFO's FTB-8510G Packet Blazer is a system for testing 10 Gigabit Ethernet (GigE) interfaces in optical networks. With the increasing deployments of 10 GigE interfaces in the network core, service providers ...

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Optical switch connects up to 16 ports in automated test systems
19 September 2007
The new AQ2200-412 from Yokogawa is a 1 x 16 low insertion loss optical switch for use in automated test systems. The unit contains 16 ports in a two-slot size module, and allows from one to 16 DUTs (devices ...

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Versatile multimeter enters its fourth generation
19 September 2007, Comtest
The new 77IV digital multimeter (DMM) has many features needed to repair most electrical and electronic faults, making it one of the most versatile in Fluke's DMM range. Fluke claims significant improvements ...

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A test system to meet the VoIP challenge
19 September 2007
The challenges facing a successful Voice-over-IP (VoIP) installation can be extremely complex both to identify and troubleshoot, yet there is a tremendous thrust both locally and internationally to forge ...

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New spring-loaded tooling pins provide minimal wear
19 September 2007, Electronic Industry Supplies
By making use of 50° mounting surfaces, Ingun's new spring-loaded tooling pins provide optimal pre-registration of a UUT (unit under test), as well as ensuring that the drilling tolerances of the tooling ...

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High energy X-ray CMOS flat panel imager
5 September 2007, Hamamatsu Photonics UK
Hamamatsu has released a new CMOS flat panel sensor for digital X-ray imaging applications. The C9321SK-05 consists of a megapixel (1056 x 1056 elements) detector array, each of 50 micron size, to provide ...

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New test solution for copper cables and networks
5 September 2007
The new NETmapper from Barlow Communications is said to be a fast, easy to use, lightweight handheld copper-link verifier which supports functions required to provide comprehensive testing and verification ...

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Wireless security and performance troubleshooting solution
5 September 2007, Concilium Technologies
Concilium Technologies has introduced the latest version of Airmagnet's wireless security and performance troubleshooting solution to the local market, the Laptop Analyser. The Laptop Analyser provides ...

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