View logic analyser and oscilloscope data on one integrated display 9 October 2002 Today almost every design is a high-speed design, with fast clock edges and data rates on even the most common IC devices. So nearly every design requires signal integrity analysis. Engineers need to ...
Unique auto-zero function for high-frequency measuring 9 October 2002, Accutronics Narda Safety Test Solutions offers high-frequency measuring devices that feature a patented 'Auto-Zero' function for stable measurement results with no disruption of the measuring process. It offers these ...
Cell station testing now simplified with portable universal RF test tool 9 October 2002 A cell site technician's job, which is to troubleshoot cellular provider base stations and monitor network performance, is now said to have been made easier with a fully portable, lightweight, universal ...
Vibration testing - is it necessary? 9 October 2002 In very simple terms, vibration testing is subjecting a unit to predetermined levels of vibration to determine its response and durability to a vibrating force.
Vibration testing brings into the laboratory ...
Signal corruption in industrial measurement 9 October 2002 In this article, Bill Englemann of Analog Devices describes the five kinds of most frequently-reported problems that engineers and technicians run into when instrumenting an industrial system. Ground ...
High-bandwidth 4+16 channel scope debuts 9 October 2002, Concilium Technologies Agilent Technologies believes it has extended its leadership in the mixed-signal oscilloscope market with the release of a new family of mixed-signal oscilloscopes (MSOs).
The Agilent 54830 Series Infinium ...
New portable data acquisition system 9 October 2002 Spescom MeasureGraph has announced the availability of a new portable data acquisition system, Vision, from Nicolet Technologies, a pioneer in the development of recorders for the physical measurement ...
Device for measurement and protection of high current systems 25 September 2002, Denver Technical Products The LKAT Plus from LEM high current systems is a noncontact high current measurement system designed for larger conductors and buswork. Suited for industrial environments such as electrochemical processing, ...
Digital phosphor scope gets enhancements 25 September 2002 Tektronix has made some enhancements to its TDS7000 Series DPOs, now being delivered on all new instruments. The new features and options address customers, concerns with signal integrity, serial bus ...
Serial instruments can now connect with USB 14 August 2002 Engineers can seamlessly connect to existing serial instruments using the widespread USB technology with two new high-speed USB serial converters from National Instruments.
The NI USB-232 and NI USB-485 ...
High accuracy current transducers 31 July 2002, Denver Technical Products LEM's IT series is of closed-loop transducers, allowing current measurements with very high accuracy, linearity and high stability. Basic specifications of the 600 A unit are as follows: * Maximum primary ...
Opti-Num Solutions develops interface between MATLAB and Keithley hardware 17 July 2002, Opti-Num Solutions The MathWorks and Keithley Instruments have announced new hardware and software interface capabilities for data acquisition applications.
Local MathWorks agent Opti-Num Solutions was responsible for ...
New 500 MHz mixed-signal oscilloscope family 17 July 2002, Concilium Technologies Agilent's new 350 MHz and 500 MHz 54640-series oscilloscopes help increase performance while continuing to solve tough problems. According to the manufacturer, this tool is ideal for R&D engineers who work ...
Fast 16-bit analog output modules for data acquisition 17 July 2002 With National Instruments' 16-bit NI PCI-6731 and NI PCI-6733 analog output modules, engineers and scientists can control waveform amplitudes with higher resolution at frequencies commonly associated ...
Optical measurement solution is scalable 17 July 2002 Design and production engineers now can measure the power of light in optical component alignment, manufacturing and test in a solution that scales from the design laboratory to the manufacturing floor.
Using ...
Spectrum analysers offer even better performance 3 July 2002, Concilium Technologies Agilent Technologies has introduced two new members of its performance spectrum analyser (PSA) family that provide engineers in aerospace/defence, emerging communications and cellular communications with ...
Optical network installation and maintenance platform is adaptable 3 July 2002, Concilium Technologies Agilent Technologies' new modular network tester is a portable, lightweight, rugged optical network test platform that is expected to set new standards for profitability in the optical network installation ...
All-in-one passive optical component test solution 3 July 2002 NetTest's TUNICS-Evolution is an all-in-one passive optical component test solution.
A natural extension of NetTest's world class tunable laser capabilities, TUNICS-Evolution can reduce testing time ...
